Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6946371 | Microelectronics Reliability | 2016 | 7 Pages |
Abstract
In this paper, a simple method to describe the effect of Printed Circuit Board (PCB) and environment on the thermal behavior of packaged devices is addressed. This approach aims at exploiting the benefit of compact thermal models, which are necessarily one-dimensional, together with the advantage of Finite Element (FE) modeling, which retains all the three-dimensional geometrical details, only in the regions of the model that must be accurately described. The main focus is on correct modeling of long power pulses for subsequent electro-thermal and thermo-mechanical analysis at chip level.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
D. Chiozzi, M. Bernardoni, N. Delmonte, P. Cova,