Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6946747 | Microelectronics Reliability | 2014 | 5 Pages |
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
B.J. Tang, K. Croes, Y. Barbarin, Y.Q. Wang, R. Degraeve, Y. Li, M. Toledano-Luque, T. Kauerauf, J. Bömmels, Zs. TÅkei, I. De Wolf,