Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10364776 | Microelectronic Engineering | 2005 | 6 Pages |
Abstract
In this study, we investigated fabrication and characteristics of germanides Schottky contacts on germanium. Ti- and Ni-germanides were fabricated on n-Ge(1 0 0) substrates by sputtering metal Ti or Ni on Ge followed by a furnace annealing. The influence of annealing temperature on the electrical properties of Ti- and Ni-germanide on n-Ge(1 0 0) substrates was investigated. The low temperature â¼300 °C annealing helped to obtain the optimized Schottky contact characteristics in both Ti-germanide/Ge and Ni-germanide/Ge substrates contacts. The well-behaved Ti-germanides/n-Ge Schottky contact with 0.34 eV barrier height was obtained by using a 300 °C annealing process.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Dedong Han, Yi Wang, Dayu Tian, Wei Wang, Xiaoyan Liu, Jinfeng Kang, Ruqi Han,