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Analysis of the substrate bias effect on the interface trapped charges in junctionless nanowire transistors through low-frequency noise characterization

Article ID Journal Published Year Pages File Type
4970804 Microelectronic Engineering 2017 19 Pages PDF
Keywords
Junctionless nanowire transistorsEffective trap densitySubstrate biasLow-frequency noise
Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
Preview
Analysis of the substrate bias effect on the interface trapped charges in junctionless nanowire transistors through low-frequency noise characterization
Authors
Rodrigo Trevisoli Doria, Renan Trevisoli, Michelly de Souza, Sylvain Barraud, Maud Vinet, Olivier Faynot, Marcelo Antonio Pavanello,
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Journal
Microelectronic Engineering
Journal: Microelectronic Engineering
Related Categories
Junctionless nanowire transistors
Effective trap density
Substrate bias
Low-frequency noise
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Computer Science Applications
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