Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
539550 | Microelectronic Engineering | 2014 | 4 Pages |
•A novel DoMPE process on SU-8 to enhance complexity of embedded microstructure.•Single-layer coating of SU-8 without bonding process.•An embedded SU-8 microstructure with asymmetric inside cross section is demonstrated.
Here a double-side multiple partial exposure (DoMPE) method is proposed to fabricate an embedded SU-8 microstructure with more flexible inside cross section. The proposed method uses standard lithography equipment and needs only single-layer coating of negative photoresist SU-8 on glass substrate without bonding process.Process parameters, including development thickness at different front and back-side partial exposure doses, are experimentally characterized. Reflection effect due to Cr layer on glass substrate is shown to have influence on the development depth of SU-8 in front partial exposure. It is found that coating thicker SU-8 not only can reduce reflection effect, but also can attenuate cross-link effect due to exposure dose accumulation on SU-8 from both front and back sides. Finally, an embedded SU-8 microstructure is demonstrated to verify that the proposed DoMPE method needs only single-layer SU-8 coating to fabricate not just embedded microstructures, but also embedded microstructure with asymmetric inside cross section.
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