Article ID Journal Published Year Pages File Type
540075 Microelectronic Engineering 2007 4 Pages PDF
Abstract

A coarse-grain method for simultaneous calculation of the resist viscous flow in nanoimprint lithography and the stamp and substrate deformation is presented. Agreement between experimental and simulated results is observed. The analysis of these results led to the conclusion that good quantitative correspondence may be only achieved by the simultaneous coarse-grain modeling performed for all structures placed on the stamp.

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Physical Sciences and Engineering Computer Science Hardware and Architecture
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