Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
540075 | Microelectronic Engineering | 2007 | 4 Pages |
Abstract
A coarse-grain method for simultaneous calculation of the resist viscous flow in nanoimprint lithography and the stamp and substrate deformation is presented. Agreement between experimental and simulated results is observed. The analysis of these results led to the conclusion that good quantitative correspondence may be only achieved by the simultaneous coarse-grain modeling performed for all structures placed on the stamp.
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Authors
Vadim Sirotkin, Alexander Svintsov, Helmut Schift, Sergey Zaitsev,