Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
540713 | Microelectronic Engineering | 2008 | 4 Pages |
Abstract
Simple treatments were made to study the possibility of polarization recovery in fatigued P(VDF–TrFE) films. Annealing at a temperature below or above the Curie point of ferroelectric films would not improve the ferroelectric property of fatigued films, while a long-time rest would induce partially or even fully polarization recovery, though P–E loops obtained from recovered films showed a rounded shape. Some discussions were also given to explain our observations.
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Authors
ZhiGang Zeng, GuoDong Zhu, Ran Liu, Qun Zhang, XueJian Yan,