Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
541754 | Microelectronic Engineering | 2007 | 5 Pages |
Abstract
In this paper we propose a silicide design consideration for electrostatic discharge (ESD) protection in nanoscale CMOS devices. According to our practical implementation, it is found that a comprehensive silicide optimization can be achieved on the gate, drain, and source sides with very few testkey designs. Our study shows that there is a high characteristic efficiency for various conditions; in particular, for optimizing the performance of sub-100 nm complementary metal-oxide-semiconductor devices in system-on-a-chip era.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Shao-Ming Yu, Jam-Wen Lee, Yiming Li,