Article ID Journal Published Year Pages File Type
541848 Microelectronic Engineering 2006 5 Pages PDF
Abstract

Directly accessible, ultralong, uniform platinum silicide nanowires in PtSi and Pt2Si are mass-fabricated by combining a sidewall transfer lithography (STL) technology and a self-aligned silicide process. The STL technology is based on standard Si technology. The self-aligned platinum silicide (PtSix) process consists of two sequential steps in a single run: a silicidation step in N2 to ensure a controllable silicide formation followed by an oxidation step in O2 to form a reliable protective SiOx layer on top of the grown PtSix. The achieved nanowires are characterised by a low resistivity: 26 ± 3 and 34 ± 2 μΩ cm for the Pt2Si- and PtSi-dominated nanowires.

Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
Authors
, , , , ,