| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 543162 | Microelectronic Engineering | 2013 | 6 Pages |
Abstract
The goal of this paper is to demonstrate the added value of vector two-tone measurements in validating a microwave transistor model. By having the phase information of the low frequency intermodulation products, the model can be evaluated completely both in frequency and time domain. The approach is illustrated on a non-dispersive FinFET.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Giovanni Crupi, Gustavo Avolio, Dominique M.M.-P. Schreurs, Guillaume Pailloncy, Alina Caddemi, Bart Nauwelaers,