Article ID Journal Published Year Pages File Type
544025 Microelectronic Engineering 2007 6 Pages PDF
Abstract

In this work, electrostatic force microscopy (EFM) and conductive atomic force microscopy (C-AFM) are applied to perform high-resolution electrical characterisation of organic photovoltaic films. These films are composed of the C60-derivative PCBM blended with hole conductive conjugated polymers PPV derivatives or P3HT. It is demonstrated that both EFM and C-AFM are able to electrically evidence phase separation in the blends, suggesting in addition higher density of carriers along interfaces. Correlation between the EFM contrast and the photovoltaic properties of the blends was observed. Local spectroscopy (I–V curves) completes the C-AFM investigations, analysing charge transport mechanisms in the P3HT:PCBM blend. Significant modifications of the local electrical properties of P3HT are shown to occur upon blending. Space charge limited current is evidenced in the blend and a hole mobility of 1.7 × 10−2 cm2 V−1 s−1 is determined for P3HT.

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