Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
544769 | Microelectronic Engineering | 2011 | 4 Pages |
Abstract
Temperature-dependent characteristics of ZnO Schottky diodes with Iridium (Ir) contact electrodes were investigated. Using Norde model, it was found that the effectively Schottky barrier heights of Ir on n-ZnO were around 0.837, 0.829, 0.801, 0.750 and 0.719 eV when measured at 25, 30, 50, 100 and 150 °C, respectively. Using Cheung’s method, it was found that Schottky barrier heights between Ir and the n-ZnO were 0.824, 0.823, 0.789, 0.743 and 0.740 eV when measured at 25, 30, 50, 100 and 150 °C, respectively. The large Schottky barrier heights suggest that Ir is a potentially useful material for ZnO-based ultraviolet Schottky barrier photodetectors and metal–semiconductor-metal photodetectors.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
S.J. Young, S.J. Chang, L.W. Ji, T.H. Meen, C.H. Hsiao, K.W. Liu, K.J. Chen, Z.S. Hu,