Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
544800 | Microelectronic Engineering | 2010 | 4 Pages |
Abstract
The removal of nanoparticles form patterned wafers is one of the main challenges facing the semiconductor industry. In this paper, the removal of 100 and 200 nm polystyrene latex (PSL) particles from silicon trenches was investigated. Red fluorescent PSL particles were utilized in the cleaning experiments and were counted using fluorescent microscopy. All the experiments were conducted in a single wafer megasonic tank using deionized water (DI). Trenches were fabricated with widths varying from 200 nm to 2 μm and with an aspect ratio of one. Results show that removal of particles from larger trenches is faster compared to smaller trenches and that megasonics power is more important in the removal process than cleaning time.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Pegah Karimi, Taehoon Kim, Juan Aceros, Jingoo Park, Ahmed A. Busnaina,