| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 545125 | Microelectronic Engineering | 2007 | 4 Pages | 
Abstract
												Yield equations are of fundamental importance for modeling problems in circuit design and semiconductor manufacturing. They have been used to model such variables as the number of faults on a chip. It appears, however, that little is known as far as explicit expressions for the yield equations are concerned. In this note, we derive the most comprehensive collection of formulas for yield equations, covering some 16 flexible families. The calculations involve use of several special functions and their properties. We feel that this work will serve as an important reference for the engineering literature.
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											Authors
												Saralees Nadarajah, Samuel Kotz, 
											