Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6942239 | Integration, the VLSI Journal | 2018 | 9 Pages |
Abstract
In this paper, a new dynamic circuit is proposed to reduce the power consumption of wide fan-in gates. Since the voltage difference across the pull-down network determines the output in the proposed circuit, the voltage swing on the pull-down network can be lowered to decrease the dramatically increasing power consumption of wide fan-in gates. Wide fan-in OR gates are designed and simulated using the proposed domino circuit in 90 nm CMOS technology. Simulation results exhibit up to 2.62X improvement in noise immunity and 44% reduction in power consumption compared to the conventional domino circuits at the same delay. Moreover, a 2-read, 1-write ported 64-word à 32-bit/word register file is designed using the proposed domino circuit. The Register file is simulated using low-Vth 90 nm CMOS model in all process corners. The results shows 25% power reduction and 32% speed improvement for the proposed register file in comparison with the conventional register file at the same noise margin floor.
Keywords
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Mohammad Asyaei,