| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6943068 | Microelectronic Engineering | 2015 | 6 Pages |
Abstract
Evaluation of RTN trap effect and amount of interface traps before and after different P/E cycles. Full and macaroni channel devices show similar interface degradation trend after P/E cycle endurance test and both of them are RTN dominated by band#2.235
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
K.H. Lee, R. Degraeve, M. Toledano-Luque, A. Arreghini, L. Breuil, P. Blomme, G. Van den bosch, J. Van Houdt,