Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6943936 | Microelectronic Engineering | 2013 | 5 Pages |
Abstract
Nyquist plots obtained from EIS measurements conducted on a 25 μm Pt microelectrode held at â0.2 V (vs Pt reference) in Ar saturated solution (50 mM potassium ferricyanide and 0.1 M KCl).
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Authors
M. Keswani, S. Raghavan, P. Deymier,