Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
6943944 | Microelectronic Engineering | 2013 | 4 Pages |
Abstract
- Polymer/nanowires /Si diodes without H2O2 treatment show a poor rectifying behavior.
- Polymer/nanowires /Si diodes with H2O2 treatment show a good rectifying behavior.
- The interfacial defects of heterojunction devices were controlled by H2O2 treatment.
- Such an improvement indicates that a good passivation is formed at the interface.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
Wei-Min Cho, Yow-Jon Lin, Hsing-Cheng Chang, Ya-Hui Chen,