| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6944057 | Microelectronic Engineering | 2013 | 4 Pages |
Abstract
- We study the dispersion in the Rsheet measurement.
- We study the light influence on the Rsheet measurement.
- We deduce a trapping mechanism in the AlGaN/GaN stack.
- We simulate the trapping phenomenon.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
J. Lehmann, C. Leroux, M. Charles, A. Torres, E. Morvan, D. Blachier, G. Ghibaudo, E. Bano, G. Reimbold,