| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6944113 | Microelectronic Engineering | 2013 | 5 Pages |
Abstract
⺠Growth of TiO2/CNT composite by an evaporation technique in UHV ambient. ⺠In the composite growth we observe chemical bonds formation only between oxygen and Ti atoms. ⺠The TiO2 film appears highly homogeneous and with a thickness of about 1.5 micron. ⺠Absence of luminescence emission from composites indicates the absence of oxygen vacancies defects.
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Authors
M. Barberio, V. Pingitore, P. Barone, M. Davoli, F. Stranges, F. Xu, A. Bonanno,