Identification of the (√E + 1/E)-dependence of porous low-k time dependent dielectric breakdown using over one year long package level tests

- Over-one-year-long test results for low-k dielectric TDDB are reported.
- A methodology has been set up to compare different models that predict lifetime.
- The lucky-electron model shows a higher ability to predict dielectric lifetime.
- The fitting parameters are determined independently from the MTTF fit.