| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 6944489 | Microelectronic Engineering | 2012 | 4 Pages |
Abstract
⺠Dielectrophoresis process conditions optimized for individual SWCNT devices yield. ⺠Electric field frequency and SWCNT dispersion concentration are critical parameters. ⺠Critical point drying successfully used to avoid stiction of assembled SWCNTs.
Related Topics
Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
H. Pathangi, G. Groeseneken, A. Witvrouw,