Article ID Journal Published Year Pages File Type
9670532 Microelectronic Engineering 2005 4 Pages PDF
Abstract
IETS (Inelastic Electron Tunnelling Spectroscopy) technique was used in Metal-Oxide-Silicon (MOS) tunnel junctions to provide information concerning the vibrational and excitational modes. In this work, we use the IETS method to investigate electron-molecular vibration coupling in SAMs (Self Assembled Monolayer) using the MOS tunnel junctions as a test-bed.
Related Topics
Physical Sciences and Engineering Computer Science Hardware and Architecture
Authors
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