| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 9670636 | Microelectronic Engineering | 2005 | 4 Pages |
Abstract
We report about the development of a planar support for biological samples. The aim is to combine AFM and patch-clamp measurements, in order to perform simultaneous measurements of topography and electrical properties of biological membranes. Sub-micrometer apertures have been fabricated using standard MEMS techniques. The electrical quality of the support has been experimentally assessed.
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Physical Sciences and Engineering
Computer Science
Hardware and Architecture
Authors
M.R. Gullo, T. Akiyama, P.L.T.M. Frederix, A. Tonin, U. Staufer, A. Engel, N.F. de Rooij,