Reliability of InGaAs focal plane array imaging of wheat germination at early stages

To assist our Kansas breeding program, we have developed nondestructive methods to test new lines of wheat for resistance to premature germination. The high sensitivity of subsurface imaging, compared with visual detection, α-amylase determination, or viscosity testing, permits germination detection at early stages. This report is concerned with detection reliability via chemical imaging of intact wheat kernels at early stages of germination by using an InGaAs focal plane detector array in the 1100–1700 nm range. Ninety kernels from each of six different cultivars, including HRW and HWW wheat, were exposed to moist conditions for 6, 12, 24, 36, and 48 h. Images of each 90 kernel group were examined, and images of those kernels exposed to moisture for 36 h were compared with images of kernels treated for 3 h as a control. Images of each were classified as sprouted or unsprouted. Criteria for classification included images of log 1/R at select wavelengths or images of select factors resulting from principle component analysis (PCA) treatment of reflectance intensity data from each pixel. Sprouted kernels determined by PCA factors 1 and 4 from 90 kernels tested in a 36-h moisture exposure numbered 87, 85, 80, 74, 70, 48 for six cultivars tested. Cultivar KS-2174 was shown to be distinctly more resistant to germination than the other cultivars. When KS-2174 was compared with Betty wheat, for all exposure times, Betty had approximately 45% more germinated kernels.