Spectroscopic phonon and extended x-ray absorption fine structure measurements on 3C-SiC/Si (001) epifilms
Keywords: 78.20.-e; 63.20.Pw; 63.20.D-; Raman scattering spectroscopy; Infrared reflectivity; Synchrotron radiation x-ray absorption fine structure; Chemical vapor deposition; Brugeeman's effective medium theory;