Applications of synchrotron X-rays in microelectronics industry research
Keywords: سیلیکید نیکل; 61.10.âi; 68.55.Jk; 68.60.Dv; 81.07.âBc; Microelectronics materials; X-ray diffraction; Synchrotron; Nickel silicide; Strained silicon; Nanoparticles;