Keywords: تغییرات فرآیند; Process variations; Behavioral equivalence checking; Model based design; Evolutionary computation; Simulink; Boundary search methodology;
مقالات ISI تغییرات فرآیند (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
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در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Keywords: تغییرات فرآیند; Robust design; Robustness metric; ElasticR method; Surrogates; Process variations
Keywords: تغییرات فرآیند; Scratch pad memory; SRAM; Process variations; Dynamic voltage and frequency scaling
Keywords: تغییرات فرآیند; FinFET; Process variations; Reliability; TDDB
SERA: statistical error rate analysis for profit-oriented performance binning of resilient circuits
Keywords: تغییرات فرآیند; Error resilient circuits; Statistical timing analysis; Process variations; Speed binning;
A near-threshold 10T differential SRAM cell with high read and write margins for tri-gated FinFET technology
Keywords: تغییرات فرآیند; FinFET; Low voltage SRAM; Process variations; Near-threshold SRAM;
Reliability analysis of spin transfer torque based look up tables under process variations and NBTI aging
Keywords: تغییرات فرآیند; Look up table (LUT); Magnetic tunnel junction (MTJ); Process variations; Sense amplifier; Spin transfer torque (STT)
A novel high-performance time-balanced wide fan-in CMOS circuit
Keywords: تغییرات فرآیند; Area; CMOS technology; Power consumption; Process variations; Time delay;
Process variability-induced NoC link failure: A probabilistic model
Keywords: تغییرات فرآیند; Current mode interconnect; Networks-on-Chip (NoC); NoC topologies; Process variations; Voltage mode interconnect
Effect of NBTI/PBTI aging and process variations on write failures in MOSFET and FinFET flip-flops
Keywords: تغییرات فرآیند; Digital VLSI; MOSFET; FinFETs; Noise margins; NBTI aging; PBTI aging; Process variations; Setup time slack
Compact modeling of response time and random-dopant-fluctuation-induced variability in nanoscale CMOS inverter
Keywords: تغییرات فرآیند; Delay model; CMOS inverter; Statistical variability; Process variations
Variability-tolerant routing algorithms for Networks-on-Chip
Keywords: تغییرات فرآیند; Networks-on-Chip (NoC); Process variations; Routing algorithms
A new clock network synthesizer for modern VLSI designs
Keywords: تغییرات فرآیند; Clock tree synthesis; Process variations
On the influence of RTA and MSA peak temperature variations on Schottky contact resistances of 6-T SRAM cells
Keywords: تغییرات فرآیند; Process variations; Rapid thermal annealing; Millisecond annealing; Contact resistances; SRAM; TCAD;
Characterizing the impact of process variation on 45 nm NoC-based CMPs
Keywords: تغییرات فرآیند; NoC (or Network-on-Chip); CMP (or Chip multiprocessor); Process variations; Process mapping; Router design
SRAM dynamic stability estimation using MPFP and its applications
Keywords: تغییرات فرآیند; SRAM yield; Dynamic stability; Process variations; Read assist; DVFS; Supply noise effects
Temperature-adaptive voltage scaling for enhanced energy efficiency in subthreshold memory arrays
Keywords: تغییرات فرآیند; Adaptive body bias; Dynamic supply voltage scaling; Noise immunity; Process variations; Reversed temperature dependence; SRAM; Subthreshold leakage; Subthreshold memory; Supply voltage tuning; Temperature variations; Threshold voltage tuning
Statistical static timing analysis: A survey
Keywords: تغییرات فرآیند; Statistical static timing analysis; Process variations; Systematic variations; Random variations; Inter-die variability; Intra-die variability
Efficient Statistical Leakage Power Analysis Method for Function Blocks Considering All Process Variations
Keywords: تغییرات فرآیند; process variations; statistical analysis; leakage power; very large scale integration (VLSI);
Impact of technology scaling and process variations on RF CMOS devices
Keywords: تغییرات فرآیند; RF CMOS; Technology scaling; Process variations; Radio frequency; CMOS device
Alpha-particle-induced SER of embedded SRAMs affected by variations in process parameters and by the use of process options
Keywords: تغییرات فرآیند; Alpha-particles; Radiation effects; Soft-errors; SER; Critical charges; SRAM; Process variations;