کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10365682 872161 2014 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Markov process based reliability model for laser diodes in space radiation environment
ترجمه فارسی عنوان
مدل اعتماد مارکف بر پایه مدل برای دیودهای لیزر در محیط تابش فضا
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
چکیده انگلیسی
The reliability of laser diodes is a prerequisite for use in satellite optical communication systems, which is significant influenced by both displacement damage effect and annealing effect. A reliability model was proposed to evaluate the reliability and lifetime for laser diodes in space radiation environment. Degradation process is separated into discrete states, and reliability model is subsequently established based on Markov process. The Markov process consists of a Poisson process and an exponential process, representing the displacement damage effect and annealing effect, respectively. Reliability characteristics of a given laser diode are simulated over 100,000 h, and applicability of this reliability model is demonstrated by analyzing the variety trend of probability density of performance states.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 54, Issue 12, December 2014, Pages 2735-2739
نویسندگان
, , , , ,