Characterization of diffraction patterns directly from in-line holograms using the Gabor transform

The Gabor transform is used for object characterization directly from in-line holograms, three-dimensional locations of the object can be determined from the Gabor transform spectrum of its in-line hologram. The relation between the Gabor angle and the location of the object is established. Simulation and experiment results are also presented to show the validity of this method. This method can be applied in particle field analysis.