کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1264731 972169 2011 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Holography and plasma oxidation for uniform nanoscale two dimensional channel formation of vertical organic field-effect transistors with suppressed gate leakage current
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی (عمومی)
پیش نمایش صفحه اول مقاله
Holography and plasma oxidation for uniform nanoscale two dimensional channel formation of vertical organic field-effect transistors with suppressed gate leakage current
چکیده انگلیسی

Vertical organic field-effect transistors (VOFETs) with nanoscale channel openings have been fabricated using pentacene as an active layer material. To achieve uniform nanoscale two-dimensional channel openings, a laser holography lithography has been introduced. Uniformly distributed and well-aligned holes with 250 nm diameter were successfully obtained with the laser holography lithography. VOFET devices with these channel openings have shown high on/off ratio of about 103 without any further treatment. Gate leakage current was also decreased with an additional insulating layer generated on the gate electrode sidewall via plasma oxidation.

Figure optionsDownload as PowerPoint slideHighlights
► We made pentacene-based vertical organic field-effect transistors (VOFETs).
► Laser holography lithography was introduced to make nanoscale channel openings.
► Uniformly distributed nanoscale two-dimensional channel openings were realized.
► Plasma oxidation was performed to oxidize sidewalls of gate electrodes in openings.
► Insulating sidewalls further reduced gate leakage current by MIS structure formation.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Organic Electronics - Volume 12, Issue 11, November 2011, Pages 1841–1845
نویسندگان
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