کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1489899 | 992313 | 2013 | 7 صفحه PDF | دانلود رایگان |
Vanadium pentoxide thin films are prepared via sol–gel spin coating method. The films coated on FTO and glass substrates are treated at different temperatures ranging from 250 °C to 400 °C. The structural, optical and electrochemical investigations are made. X-ray diffraction analysis shows the film to be composed of V2O5 in β-phase up to annealing temperature of 350 °C and at 400 °C the structural transformation to α-phase is observed. FTIR spectrum shows the formation of VO bond. The SEM images reveal the formation of nanopores. Optical absorption studies indicate a band gap of 2.2–2.4 eV. The supercapacitor behaviour is studied using cyclic voltammetery technique and electrochemical impedance analysis. The vanadium pentoxide films annealed at 300 °C for an hour exhibits a maximum specific capacitance of 346 F g−1 at a scan rate of 5 mV s−1.
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► Structural, optical, supercapacitor properties of β-V2O5 thin films are reported.
► Influence of annealing temperature on β-V2O5 thin films have been studied.
► Film annealed at 300 °C exhibit lower charge transfer resistance.
Journal: Materials Research Bulletin - Volume 48, Issue 2, February 2013, Pages 760–766