کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1499587 | 993313 | 2011 | 4 صفحه PDF | دانلود رایگان |
The thermodynamics of structural phase transformations in thin films depends on the mechanical stress that can be released by plastic deformation. For thin films below a critical film thickness, plastic deformation is energetically unfavourable: thus, the system stays coherent and stress remains. For PdHc films less than 22 nm thick, a new situation emerges: while the interfaces between matrix and hydride precipitates remain coherent throughout the complete phase transition, misfit dislocations form between the hydride phase and the substrate.
► Stress evolving during phase transformation changes thermodynamic properties of thin films.
► We investigate stress relaxation mechanisms inPdHc thin films during hydrogen loading.
► Below 22 nm film thickness misfit dislocations emerge between hydride phase and substrate.
► Below 22 nm film thickness misfit dislocation loop formation around precipitates is not possible.
► This yields a new state of partial coherency in thin films.
Journal: Scripta Materialia - Volume 64, Issue 10, May 2011, Pages 978–981