کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1535931 1512636 2012 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Fringe analysis and enhanced characterization of sub-surface defects using fringe-shifted shearograms
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Fringe analysis and enhanced characterization of sub-surface defects using fringe-shifted shearograms
چکیده انگلیسی

A technique for fringe analysis using variance of directly fringe-shifted shearograms is demonstrated experimentally. Statistical variations in each of the fringe-shifted shearograms are calculated to obtain a contrast map which is then used to characterize sub-surface defects and mechanical loading points. The technique offers reduced computational load compared to Fourier transform-based fringe processing algorithms. The technique is implemented using both phase difference maps and interferograms. The latter allows the extension of the technique to physical (i.e., non-reconstructed) interferograms for the analysis of dynamic systems.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics Communications - Volume 285, Issues 21–22, 1 October 2012, Pages 4223–4226
نویسندگان
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