Measurement of nonlinear refraction using a reversal 4f coherent imaging system with phase objects

A reversal 4f coherent imaging system with phase objects is presented to measure nonlinear refraction of the materials. The modified system can increase the sensitivity compared with the conventional nonlinear-imaging technique with phase objects. The sensitivity enhancement of the modified system is about two times greater than the conventional technique within 0 ≤ ΔφNL ≤ 1. CS2 is used to demonstrate the measurement using the reversal 4f coherent imaging system with phase objects.