کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1541066 | 996673 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Concerning the impact of polishing induced contamination of fused silica optics on the laser-induced damage density at 351 nm
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
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چکیده انگلیسی
We analyze the effect of polishing induced contaminants on the laser-induced damage density at the wavelength of 351 nm. Fused silica polished parts were manufactured using various polishing processes. If previous works have shown that high polishing induced cerium content leads to high laser-induced damage density, we show that for low cerium content, there is no correlation between the amount of polishing induced cerium contamination in the part interface and the damage density. This can be also extended to other polishing induced contaminants. These results provide new information for the understanding of laser damage initiation.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics Communications - Volume 281, Issue 14, 15 July 2008, Pages 3802–3805
Journal: Optics Communications - Volume 281, Issue 14, 15 July 2008, Pages 3802–3805
نویسندگان
J. Neauport, P. Cormont, L. Lamaignère, C. Ambard, F. Pilon, H. Bercegol,