TEM characterization of pure and transition metal enhanced NaAlH4

▶ NaAlH4 is highly unstable under the electron beam. ▶ Only TEM techniques with a low electron flux can be used to avoid sample decomposition. ▶ TEM combined with X-ray diffraction can determine the location of the Al1−xTMx phases. ▶ The TM containing phases are stable and can be investigated with atomic resolution.