کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1667166 | 1008844 | 2012 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Raman spectroscopic and X-ray diffraction investigations of epitaxial BiCrO3 thin films
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Epitaxial BiCrO3 thin films were grown onto NdGaO3 (110)- and (LaAlO3)0.3-(Sr2AlTaO6)0.7 (100)-oriented substrates by pulsed laser deposition. High resolution X-ray diffraction and pole figure measurements were performed in order to obtain information about the crystal structure of the films, about their quality and about the mutual crystallographic orientation between the films and the substrates. The monoclinic (111) plane of BiCrO3 was found out to be parallel to the substrate surface. The epitaxial relation between films and substrates was verified by using polarisation dependent Raman spectroscopic experiments and theoretical calculations based on symmetry.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 520, Issue 14, 1 May 2012, Pages 4590–4594
Journal: Thin Solid Films - Volume 520, Issue 14, 1 May 2012, Pages 4590–4594
نویسندگان
Andreas Talkenberger, Cameliu Himcinschi, Torsten Weißbach, Kannan Vijayanandhini, Ionela Vrejoiu, Christian Röder, David Rafaja, Jens Kortus,