کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1667201 | 1008844 | 2012 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Radiofrequency dielectric properties of amorphous semiconducting Y-Ba-Cu-O oxide thin films for bolometric detection
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
We report the study of dielectric properties of amorphous semiconducting YBCO thin films measured in a broad frequency range, from 40Â Hz to 2Â GHz and in the 210 to 430Â K temperature range, using a coaxial discontinuity technique. At all temperatures, dielectric permittivity and conductivity spectra exhibit typical features of dielectric relaxation processes. A first relaxation at low frequency (300Â Hz-2Â kHz), observed only at high temperature, might be attributed to interfacial effects. Polarization in the grains of the YBCO thin films could lead to the second relaxation observed at higher frequency (800Â Hz-660Â kHz). The relaxation frequencies increase with temperature and follow a thermally activated behavior of the Arrhenius-type. Optical near-infrared response of YBCO bolometers exhibits a corner frequency around 40Â kHz. Above this frequency, the thermal diffusion is localized inside the YBCO thin film. This frequency is in good agreement with the relaxation frequency attributed to YBCO grains in the thin film, i.e. around 40Â kHz at 300Â K.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 520, Issue 14, 1 May 2012, Pages 4749-4753
Journal: Thin Solid Films - Volume 520, Issue 14, 1 May 2012, Pages 4749-4753
نویسندگان
Aurélie Gensbittel, Olivier Dubrunfaut, Vishal S. Jagtap, Alain J. Kreisler, Annick F. Dégardin,