کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1676491 | 1518101 | 2006 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Characterization of molecular assemblies on silicon surfaces by attenuated total reflectance infrared spectroscopy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Alkyl monolayers anchored to Si(111) were prepared in diluted and neat 1-alkene by thermal reaction. Monolayers prepared were investigated by attenuated total reflectance infrared spectroscopy. It was found that alkyl chains in the monolayers anchored to Si(111) had an all-trans conformation. Monolayers prepared in diluted 1-alkene were identical with that prepared in neat 1-alkene. The rate of reaction between 1-alkene and hydrogen-terminated silicon remarkably depended on the concentration of 1-alkene.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 499, Issues 1–2, 21 March 2006, Pages 8–12
Journal: Thin Solid Films - Volume 499, Issues 1–2, 21 March 2006, Pages 8–12
نویسندگان
Masato Ara, Ryo Yamada, Hirokazu Tada,