کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1676491 1518101 2006 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Characterization of molecular assemblies on silicon surfaces by attenuated total reflectance infrared spectroscopy
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Characterization of molecular assemblies on silicon surfaces by attenuated total reflectance infrared spectroscopy
چکیده انگلیسی

Alkyl monolayers anchored to Si(111) were prepared in diluted and neat 1-alkene by thermal reaction. Monolayers prepared were investigated by attenuated total reflectance infrared spectroscopy. It was found that alkyl chains in the monolayers anchored to Si(111) had an all-trans conformation. Monolayers prepared in diluted 1-alkene were identical with that prepared in neat 1-alkene. The rate of reaction between 1-alkene and hydrogen-terminated silicon remarkably depended on the concentration of 1-alkene.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 499, Issues 1–2, 21 March 2006, Pages 8–12
نویسندگان
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