کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1676660 | 1009005 | 2006 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Structures of Co90Fe10/Cu multilayers determined by X-ray anomalous scattering measurements
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Structures of Co90Fe10/Cu multilayers determined by X-ray anomalous scattering measurements Structures of Co90Fe10/Cu multilayers determined by X-ray anomalous scattering measurements](/preview/png/1676660.png)
چکیده انگلیسی
The structures of Co90Fe10/Cu multilayers were investigated by X-ray anomalous scattering techniques. It is found that the Cu/Co90Fe10 and Co90Fe10/Cu interfaces have different thermal behavior upon annealing. For the as-deposited sample, a Cu2Co intermixing region exists at the Cu/Co90Fe10 interface, while the Co90Fe10/Cu interface is sharp. There exists only a Co70Fe30 sublayer close to the interface in the Co90Fe10 layer. After annealing at 285 °C for 2 h, more Cu react with Co to create a Cu3Co intermixing region at the Cu/Co90Fe10 interface, while no obvious change is observed at the Co90Fe10/Cu interface. The X-ray diffuse scattering measurements performed with the incident X-ray energy close to Fe, Co and Cu K edges, respectively, revealed an island growth mechanism of the multilayers.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 496, Issue 2, 21 February 2006, Pages 571-575
Journal: Thin Solid Films - Volume 496, Issue 2, 21 February 2006, Pages 571-575
نویسندگان
Y.K. An, B. Dai, Z.H. Mai, J.W. Cai, Z.H. Wu,