کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1856957 1529396 2016 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Impact of reduction of flux overlap region on kilovoltage cone-beam computed tomography image quality and patients’ exposure dose
ترجمه فارسی عنوان
تاثیر کاهش منطقه همپوشانی شار بر کیفیت تصویر توموگرافی و دوز مواجهه بیماران محاسبه شده با پرتومخروطی کیلوولتاژ
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک هسته ای و انرژی بالا
چکیده انگلیسی

AimIn high-precision radiation therapy, kilovoltage cone-beam computed tomography plays an important role in verifying the position of patient and localization of the target. However, the exposure dose is a problem with kilovoltage cone-beam computed tomography. Flux overlap region increases the patient dose around the center when the scan is performed in a full-scan mode. We assessed the influence of flux overlap region in a full-scan mode to understand the relationship between dose and image quality and investigated methods to achieve a dose reduction.MethodA Catphan phantom was scanned using various flux overlap region patterns in the pelvis on a full-scan mode. We used an intensity-modulated radiation therapy phantom for measuring the central dose. DoseLab was used to perform image analysis and to evaluate the linearity of the computed tomography values, uniformity, high-contrast resolution, and contrast-to-noise ratio.ResultsThe Hounsfield unit value varied by ±40 Hounsfield unit of the acceptance value for the X1 field size of 3.5 cm. However, there were no differences in high-contrast resolution and contrast-to-noise ratio among different scan patterns. The absorbed dose decreased by 7% at maximum for the case within the tolerance value.ConclusionDose reduction is possible by reducing the overlap region after calibration and by performing computed tomography in the appropriate overlap region.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Reports of Practical Oncology & Radiotherapy - Volume 21, Issue 5, September–October 2016, Pages 460–465
نویسندگان
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