Measurement of L3 subshell absorption jump ratios and jump factors for high Z elements using EDXRF technique

Energy dispersive X-ray fluorescence technique (EDXRF) has been employed for measuring L3-subshell absorption jump ratios, rL3 and jump factors, JL3 for high Z elements. Jump factors and jump ratios for these elements have been determined by measuring L3 subshell fluorescence parameters such as L3 subshell X-ray production cross section σL3, L3 subshell fluorescence yield, ωL3, total L3 subshell and higher subshells photoionization cross section σLT. Measurements were performed using a Cd-109 radioactive point source and an Si(Li) detector in direct excitation experimental geometry. Measured values for jump factors and jump ratios have been compared with theoretically calculated and other experimental values.