کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
4986033 1454795 2017 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Effect of grain size on the electrical failure of copper contacts in fretting motion
ترجمه فارسی عنوان
اثر اندازه دانه بر شکست الکتریکی اتصالات مس در حرکت
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی شیمی شیمی کلوئیدی و سطحی
چکیده انگلیسی
The influence of grain size on degradation of electrical contacts during fretting wear was investigated. Copper polycrystals with grain sizes of 2-162 µm were used to examine friction, wear, and electrical contact resistance. The results showed that the electrical contact failure was caused by the compact oxide layer produced at the contact junction. Copper specimens with smaller grains had a longer lifecycle because of grain-size strengthening. However, this strengthening effect was limited to a critical grain size and, with further increase in grain size, plastic deformation underneath the contact surface played a major role in delaying the contact failure caused by oxide formation on the fretting surface.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Tribology International - Volume 111, July 2017, Pages 39-45
نویسندگان
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