|کد مقاله||کد نشریه||سال انتشار||مقاله انگلیسی||ترجمه فارسی||نسخه تمام متن|
|4992425||1368141||2018||10 صفحه PDF||ندارد||دانلود رایگان|
â¢Method to compute the interface shape of evaporative transparent thin liquid film is proposed.â¢High accuracy measurement for contact angle between 2 and 40 degrees.â¢High accuracy interface shape and contact line velocity measurement.
The aim of this study was to present an original method to compute the shape of the interface in the vicinity of the contact line after liquid film breakup. The liquid film is a controlled volume of evaporating liquid (HFE7100) filling a millimetric cylindrical vertical well. During the evaporation process, the liquid-gas interface takes on a toroidal shape delimiting an axisymmetric liquid meniscus (together with the well bottom and side walls). The first step of the evaporation process occurs without a contact line on the bottom and is followed, in the second step, by the creation and growth of a dry patch delimited by a circular contact line on the well bottom. The shape of the meniscus interface and the position of the contact line are instantaneously measured by laser sheet sounding from below and numerical inversion. This technique determines the variation of the light intensity of a laser sheet due to its refraction through consecutive interfaces (solid-liquid-vapor).The intensity of the laser sheet impact on a perpendicular screen is inverted. The inversion results provide the shape of the interface and the position of the contact line during the evaporation process. By this new method contact angles between 2 and 40 degrees can be measured and the interface shape can be obtained with high accuracy. This method is specially adapted for concave shape, as meniscus, where side view is not possible. It is perfectly complementary with the other classical methods (e.g., interferometry and goniometry).
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Journal: Experimental Thermal and Fluid Science - Volume 90, January 2018, Pages 66-75