کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5025677 | 1470597 | 2017 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Effects of Seidel aberration and light polarization on the resolution of STED imaging
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی (عمومی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The aberrations in microscope system and polarization of the input light beam directly determine the quality of the depletion patterns, which mainly affect the resolution improvement of Stimulated Emission Depletion (STED) microscopy. In the paper, the influences of combining Seidel aberrations and light polarization on the depletion patterns were analyzed comprehensively. And a comparative study about the effects on the resolution was conducted. Simulation results show that the right-handed circularly polarization is the best choice for the depletion patterns in the same condition. And the serious aberration will influence the realization of super-resolution. This study could provide a reliable theoretical basis for a realization of a STED super-resolution system with less aberration.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optik - International Journal for Light and Electron Optics - Volume 130, February 2017, Pages 76-81
Journal: Optik - International Journal for Light and Electron Optics - Volume 130, February 2017, Pages 76-81
نویسندگان
Xiaogang Chen, Jianling Chen, Shiqing Dong, Hongqin Yang, Shusen Xie,