کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
545781 | 1450556 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Influence of the organic pollution on the reliability of HE9 connectors
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
Edge connectors are very commonly used in instrumentation and control (I&C). Failures are difficult to explain and to predict. As a consequence the long-term reliability is difficult to demonstrate. We present in this paper the results of studies we carried out on the influence of the organic pollution in the reliability of HE9 connectors that have been used for more than 25 years. We demonstrate that organic pollution is one of the main important factor that influences the reliability and give an analysis method to evaluate its impact.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 48, Issues 8–9, August–September 2008, Pages 1129–1132
Journal: Microelectronics Reliability - Volume 48, Issues 8–9, August–September 2008, Pages 1129–1132
نویسندگان
L. Crétinon, M. El Hadachi, F. Augereau, L. Doireau, G. Despaux,