کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
545787 1450556 2008 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Lifetime analysis of solder joints in high power IGBT modules for increasing the reliability for operation at 150 °C
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Lifetime analysis of solder joints in high power IGBT modules for increasing the reliability for operation at 150 °C
چکیده انگلیسی

The increased demand for higher operating junction temperatures in IGBT modules is a main challenge for future packaging technologies. Two critical design features regarding this aspect include the terminal solder joints and the large area solder joints. The main focus of this investigation is on the consequences of raising the maximum operating temperature of IGBT modules and the required design modifications of solder materials at a microstructure level for tackling the drawbacks of state-of-the-art technologies.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 48, Issues 8–9, August–September 2008, Pages 1161–1166
نویسندگان
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