Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED

In this paper, to improve the reliability of InGaN white LED Backlight module, we have analyzed the module level accelerated life test (ALT) for LED which is used for the front display in the refrigerator. In addition, we have suggested a screen method that enables to screen out LEDs which have potential leakage problems. The stress factors and levels were decided based on the end user environment in the field. The acceleration factor (AF) was logically calculated according to the stress factor. After 12 h of ALT, we have found one brightness degradation in 6480 LEDs (98 modules). It was found from the failure analysis that the leakage was from the P-pad electrode failure and caused the brightness degradation. We have suggested a method that enables to screen the potential field failure LEDs in mass production which the failure can be occurred by external noise factor. We have added “turn on current level screen” on “operating current level screen”. As a result, we could make possible to screen leakage LEDs effectively which may fail in the end user side. This method was applied by 20 LED makers.