کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
545846 1450556 2008 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Automotive IC reliability: Elements of the battle towards zero defects
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Automotive IC reliability: Elements of the battle towards zero defects
چکیده انگلیسی

The battle towards zero defects consists of fast response to PPM signals, prevention of incidents and continuous improvement. In this paper elements of all three branches are treated. A PPM analysis tool called quality crawl charts is introduced that enables prediction of customer complaint levels based on an early set of warranty call rate data. The fact that the automotive industry is very cautious with process and product changes can be better understood better with a given practical example of a small change with (in the eyes of automotive) big consequences. Finally it is shown that continuous PPM reduction activities also have an effect on the number of EOS/ESD customer returns, and that this category of fails form a shared responsibility for both supplier and customer.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 48, Issues 8–9, August–September 2008, Pages 1459–1463
نویسندگان
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